Measuring nanoscale stress intensity factors with an atomic force microscope

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Atomic Force Microscopy images of a crack intersecting the free surface of a glass specimen are taken at different stages of subcritical propagation. From the analysis of image pairs, it is shown that a novel Integrated Digital Image Correlation technique allows to measure stress intensity factors in a quantitative fashion. Image sizes as small as 200nm can be exploited and the surface displacement fields do not show significant deviations from linear elastic solutions down to a 10 nm distance from the crack tip. Moreover, this analysis gives access to the out-of-plane displacement of the free surface at the crack tip.

Han K, Ciccotti M. and S. Roux, 2010. Measuring nanoscale stress intensity factors with an atomic force microscope. EPL. 89. Art 66003

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