Measuring nanoscale stress intensity factors with an atomic force microscope

Informations Contextuelles

Atomic Force Microscopy images of a crack intersecting the free surface of a glass specimen are taken at different stages of subcritical propagation. From the analysis of image pairs, it is shown that a novel Integrated Digital Image Correlation technique allows to measure stress intensity factors in a quantitative fashion. Image sizes as small as 200nm can be exploited and the surface displacement fields do not show significant deviations from linear elastic solutions down to a 10 nm distance from the crack tip. Moreover, this analysis gives access to the out-of-plane displacement of the free surface at the crack tip.

Han K, Ciccotti M. and S. Roux, 2010. Measuring nanoscale stress intensity factors with an atomic force microscope. EPL. 89. Art 66003


Haut de page



À lire aussi...

Intermittent stick-slip dynamics during the peeling of an adhesive tape from a roller, PRE, 2013

PP Cortet, MJ Dalbe, C Guerra, C Cohen, M Ciccotti, S Santucci, and Loïc Vanel, 2013. Intermittent stick-slip dynamics during the peeling of an (...) 

> Lire la suite...

Stress-enhanced ion diffusion at the vicinity of a crack tip as evidenced by atomic force microscopy in silicate glasses

Célarié F., Ciccotti M. and Marlière C, 2007. Stress-enhanced ion diffusion at the vicinity of a crack tip as evidenced by atomic force microscopy (...) 

> Lire la suite...